The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2016
Filed:
Dec. 16, 2010
Applicants:
Yuki Omagari, Yokohama, JP;
Mitsuru Uratani, Kawasaki, JP;
Yuki Ishida, Kawasaki, JP;
Seiji Abe, Kawasaki, JP;
Masaaki Obayashi, Kawasaki, JP;
Inventors:
Yuki Omagari, Yokohama, JP;
Mitsuru Uratani, Kawasaki, JP;
Yuki Ishida, Kawasaki, JP;
Seiji Abe, Kawasaki, JP;
Masaaki Obayashi, Kawasaki, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/60 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/6033 (2013.01); H04N 1/00002 (2013.01); H04N 1/0009 (2013.01); H04N 1/00015 (2013.01); H04N 1/00023 (2013.01); H04N 1/00031 (2013.01); H04N 1/00045 (2013.01); H04N 1/00053 (2013.01); H04N 1/00058 (2013.01); H04N 1/00063 (2013.01); H04N 1/00087 (2013.01); H04N 2201/0006 (2013.01);
Abstract
According to the present invention, patch data is printed in such a manner that the length of a low-optical-density patch is small and the length of a high-optical-density patch is large. In addition, the measurement is performed by a sensor that measures at a constant scanning speed. Therefore, SN of a dark patch having a high optical density is improved, and a patch chart can be measured in a short time.