The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2016
Filed:
Jul. 09, 2015
Texas Instruments Incorporated, Dallas, TX (US);
Liran Brecher, Kfar Saba, IL;
Shai Erez, Holon, IL;
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
A method includes processing an input sequence of samples of an orthogonal frequency division multiplexing signal (OFDM) to reduce a peak to average power ratio (PAPR) of the OFDM signal with given constraints of an error vector magnitude (EVM) parameter and a spectral mask parameter for the OFDM signal during a first processing iteration. The method includes performing at least one other iteration of the first processing iteration on a subsequent time domain sequence generated in the first processing iteration to reduce the PAPR of the OFDM signal below a system target PAPR threshold and below threshold limits for the EVM parameter and the spectral mask parameter.