The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2016
Filed:
Feb. 23, 2015
Wisconsin Alumni Research Foundation, Madison, WI (US);
Akbar M. Sayeed, Madison, WI (US);
John H. Brady, Madison, WI (US);
Wisconsin Alumni Research Foundation, Madison, WI (US);
Abstract
Beam measurement values are computed by transforming a signal to a beamspace representation using a beamforming matrix that includes a plurality of columns that define a plurality of beams. A second plurality of beams is selected from the plurality of beams based on a power captured by each beam derived from the computed beam measurement values. For each beam of the second plurality of beams as a first beam, a spatial phase shift component and a temporal delay component is computed based on the fixed spatial angle associated with the first beam and a carrier frequency, a filter is defined using the spatial phase shift component and the temporal delay component, a beam measurement value associated with the first beam from the computed beam measurement values is selected, and the defined filter is applied to the selected beam measurement value to define a filtered value.