The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2016

Filed:

Sep. 04, 2015
Applicant:

Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;

Inventors:

Yusuke Wachi, Tokyo, JP;

Ichiro Somada, Tokyo, JP;

Takao Okazaki, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03B 5/24 (2006.01);
U.S. Cl.
CPC ...
H03B 5/24 (2013.01);
Abstract

Provided is an amplifier with a test oscillator for a high frequency characteristic monitor, which has small power loss in a normal operation state and secures good noise performance while it is possible to equip both a transmitter IC and a receiver IC with the amplifier. In a high frequency IC including an amplifier including an inductive load and a test oscillator arranged in a same chip, the test oscillator commonly uses the inductive load of the amplifier, the amplifier has a bias voltage terminal to switch an operation state into an active state/inactive state, and the oscillator has a bias voltage terminal to switch an operation state into an active state/inactive state. In a test operation mode, the amplifier is inactivated and the test oscillator is activated and in a normal operation mode, the amplifier is activated and the test oscillator is inactivated.


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