The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2016
Filed:
Sep. 10, 2014
Applicants:
Orville T. Farmer, Iii, Kennewick, WA (US);
Martin Liezers, Richland, WA (US);
Inventors:
Orville T. Farmer, III, Kennewick, WA (US);
Martin Liezers, Richland, WA (US);
Assignee:
BATTELLE MEMORIAL INSTITUTE, Richland, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/04 (2006.01); H01J 37/317 (2006.01); G01N 1/40 (2006.01); H01J 37/05 (2006.01); G01N 1/44 (2006.01); G01N 1/38 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0459 (2013.01); H01J 49/04 (2013.01); G01N 1/405 (2013.01); G01N 1/44 (2013.01); G01N 2001/388 (2013.01); H01J 37/05 (2013.01); H01J 37/3171 (2013.01);
Abstract
A system and process are disclosed for ultrasensitive determination of target isotopes of analytical interest in a sample. Target isotopes may be implanted in an implant area on a high-purity substrate to pre-concentrate the target isotopes free of contaminants. A known quantity of a tracer isotope may also be implanted. Target isotopes and tracer isotopes may be determined in a mass spectrometer. The present invention provides ultrasensitive determination of target isotopes in the sample.