The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2016

Filed:

Mar. 28, 2014
Applicant:

Lenovo (Singapore) Pte, Ltd., New Tech Park, SG;

Inventors:

Arnold S. Weksler, Raleigh, NC (US);

André Breda Carneiro, Trujillo, BR;

Rodrigo Fernandes Freitas, Benfica, BR;

Frederico Rhae Maciel Leal, Passaré, BR;

Marcelo Araujo Lima, Fortaleza, BR;

Fernando José Vieira da Silva, Tatuí, BR;

Fernando Ferraz Silva, Sorocaba, BR;

Francisco Plinio Oliveira Silveira, Qintino Cunha, BR;

Assignee:

Lenovo (Singapore) PTE. LTD., New Tech Park, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/18 (2006.01); G11C 29/10 (2006.01); G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G11C 29/18 (2013.01); G11C 29/10 (2013.01); G11C 29/44 (2013.01);
Abstract

For performing advanced memory test diagnostics, an apparatus, method, and computer program product are disclosed. The apparatus may include a processor, a memory that stores code executable by the processor, an address space module that identifies an address space having a plurality of blocks of memory addresses, a memory diagnostic module that performs, at least three times, a memory test procedure using a block pattern, wherein a first block pattern is used the first time, a second block pattern is used the second time, and a third block pattern is used the third time, and a memory fault module that determines the presence of a memory fault based on results of the memory test procedures.


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