The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2016

Filed:

Jul. 15, 2013
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, Tokyo, JP;

Inventors:

Chikako Tokunaga, Kanagawa-ken, JP;

Kenichi Anzou, Kanagawa-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/12 (2006.01); G11C 29/02 (2006.01); G11C 29/18 (2006.01); G11C 29/40 (2006.01); G11C 29/44 (2006.01); G11C 29/04 (2006.01); G11C 29/36 (2006.01);
U.S. Cl.
CPC ...
G11C 29/12 (2013.01); G11C 29/02 (2013.01); G11C 29/18 (2013.01); G11C 29/40 (2013.01); G11C 29/44 (2013.01); G11C 2029/0405 (2013.01); G11C 2029/3602 (2013.01);
Abstract

According to an embodiment, a semiconductor integrated circuit includes a memory, a bypass circuit, a first selection unit, a compression unit, and a comparison unit. The bypass circuit bypasses the test signal to output a bypass signal. When the memory is tested using a BIST circuit, the first selection unit selects a memory signal output from the memory in response to the test signal. When the BIST circuit is tested, the first selection unit selects the bypass signal. If the memory is tested, the compression unit holds a signal output from the first selection unit and if the BIST circuit is tested, the compression unit compresses and holds the signal output from the first selection unit. The comparison unit compares the signal held in the compression unit with an expectation value signal of the memory signal which is generated in the BIST circuit.


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