The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2016
Filed:
Aug. 29, 2014
Leica Geosystems Ag, Heerbrugg, CH;
Derik Schroeter, Heerbrugg, CH;
Gregory Walsh, Walnut Creek, CA (US);
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Abstract
A method may include projecting, onto a first projection plane of a first projection volume, first points from a point cloud of a setting that are within the first projection volume. Further, the method may include matching a plurality of the projected first points with a cross-section template that corresponds to a line parametric object (LPO) of the setting to determine a plurality of first element points of a first primary projected element. Additionally, the method may include projecting, onto a second projection plane of a second projection volume, second points from the point cloud that are within the second projection volume and matching a plurality of the projected second points with the cross-section template to determine a plurality of second element points of a second primary projected element. Moreover, the method may include generating a parameter function based on the first element points and the second element points.