The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2016

Filed:

Jan. 28, 2014
Applicant:

GE Medical Systems Global Technology Company, Llc, Waukesha, WI (US);

Inventors:

Jun Li, Beijing, CN;

Shuo Li, Beijing, CN;

Juan Zhong, Beijing, CN;

Jiaqin Dong, Beijing, CN;

Abhishek Rawat, Bangalore, IN;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06T 1/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
G06T 1/005 (2013.01); A61B 6/032 (2013.01); A61B 6/4233 (2013.01); A61B 6/5205 (2013.01);
Abstract

A method and apparatus for data conversion in an unequal γ angle CT system. The method for imaging in a CT system having a flat module detector array includes obtaining fan beam projection data of an object from a CT scan, obtaining a geometric structure parameter of the flat module detector array; rebinning data from the fan beam projection data to parallel beam projection data based on the geometric structure parameter to convert the fan beam projection data into the parallel beam projection data, and generating a CT image from the parallel beam projection data.


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