The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2016

Filed:

Sep. 13, 2012
Applicants:

Mehul Shroff, Austin, TX (US);

Peter Abramowitz, Austin, TX (US);

Xavier Hours, Tournefeuille, FR;

Inventors:

Mehul Shroff, Austin, TX (US);

Peter Abramowitz, Austin, TX (US);

Xavier Hours, Tournefeuille, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 11/26 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); G06F 11/261 (2013.01); G06F 17/5022 (2013.01); G06F 17/5045 (2013.01); G06F 17/5081 (2013.01);
Abstract

A simulation system for testing a simulation of a device against one or more violation rules is described. The simulation system comprises a device simulator for executing the simulation of the device using a device design, a device model and a simulation scenario; and one or more violation monitor for each violation rule. At least one of the violation monitors comprises a violation information detector and a threshold controller. The violation information detector is arranged to detect one or more violations of the respective violation rule of the one or more violation rules during the executing the simulation of the device and, for each violation, determine information representing the respective violation, wherein the detecting the one or more violations comprises comparing a simulated parameter against a threshold. The threshold controller is arranged to determine the threshold for the respective violation rule of the one or more violation rules in dependence on a temporal characteristic of a violation associated with the respective violation rule. A method of testing a simulation of a device against one or more violation rules is also described.


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