The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2016
Filed:
Aug. 19, 2013
Applicant:
Sandisk Technologies Inc., Plano, TX (US);
Inventors:
Preeti Yadav, Cupertino, CA (US);
Barys Sarana, Fremont, CA (US);
Abhijeet Bhalerao, San Jose, CA (US);
Frederick Fernandez, San Francisco, CA (US);
Namita Joshi, San Jose, CA (US);
Assignee:
SanDisk Technologies LLC, Plano, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 13/00 (2006.01); G06F 13/28 (2006.01); G06F 12/02 (2006.01); G06F 13/42 (2006.01); G11C 11/56 (2006.01); G11C 16/10 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0246 (2013.01); G06F 13/4234 (2013.01); G11C 11/5628 (2013.01); G11C 16/102 (2013.01); G11C 29/50012 (2013.01);
Abstract
A nonvolatile memory die is tested to determine certain parameters such as read time, which are then recorded in the nonvolatile memory die. After the die is incorporated into a memory system, and firmware is downloaded, the nonvolatile memory system uses the recorded parameters to determine how to configure the memory system for operation within specified limits, such as determining how much delay to apply to read operations.