The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2016

Filed:

Jun. 25, 2014
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Zhipeng Zhang, Shanghai, CN;

Shouyuan Cheng, Shanghai, CN;

Binbin Deng, Shanghai, CN;

Bo Wu, Shanghai, CN;

Binhua Lu, Shanghai, CN;

Scott D. Von Rhee, Boston, MA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01); G06F 9/445 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3664 (2013.01); G06F 11/3684 (2013.01); G06F 9/44589 (2013.01); G06F 11/3466 (2013.01);
Abstract

Described are techniques for testing software. The techniques may include identifying, at a first point in time, first code that has been modified, identifying, using first mapping information, a testing set of one or more test cases wherein the first mapping information identifies each test case of the testing set as a test case used to test the first code, running the testing set, generating coverage information in accordance with executing; analyzing the coverage information, generating second mapping information in accordance with said analyzing, and updating the first mapping information in accordance with the second mapping information.


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