The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2016
Filed:
Oct. 31, 2012
Applicants:
Scott P. Nixon, Fort Collins, CO (US);
Eric M. Rentschler, Windsor, CO (US);
Inventors:
Scott P. Nixon, Fort Collins, CO (US);
Eric M. Rentschler, Windsor, CO (US);
Assignee:
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 11/27 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/27 (2013.01); G06F 11/3065 (2013.01); G06F 11/348 (2013.01); G06F 11/3656 (2013.01); G06F 11/3648 (2013.01); G06F 2201/86 (2013.01);
Abstract
A method and apparatus for distributed on-chip debug triggering is presented. A first bus includes a plurality of lines and a debugging state machine configurable to monitor the plurality of lines of the first bus. One or more nodes are configurable to detect triggering events and provide, in response to detecting one or more triggering events, signals to the debugging state machine using a first subset of the plurality of lines that is allocated to the node(s).