The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2016

Filed:

Feb. 14, 2014
Applicant:

Wistron Corp., New Taipei, TW;

Inventors:

Kuo-Hsien Lu, New Taipei, TW;

Yu-Yen Chen, New Taipei, TW;

Assignee:

WISTRON CORP., New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/042 (2006.01); G06F 3/041 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0421 (2013.01); G06F 3/0418 (2013.01);
Abstract

An optical-touch calibration method and an optical-touch panel are disclosed herein. The optical-touch calibration method is suitable for the optical-touch panel including a projective light source and a line optical sensor. The optical-touch calibration method includes steps of: generating a projective beam by the projective light source, and the projective beam being reflected to the line optical sensor; utilizing the line optical sensor to measure the reflected projective beam for obtaining a reflected intensity curve relative to a linear coordinate axis; calculating an intensity difference between the reflected intensity curve and a reference intensity curve; and, adjusting an emitting power of the projective light source if the intensity difference exceeds a threshold value.


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