The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2016
Filed:
Jul. 02, 2012
Ken Tanimura, Osaka, JP;
Ken Tanimura, Osaka, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
Provided is a method of assembling and adjusting multi-beam scanning optical apparatus including a light source unit having multiple light emitting points, a deflecting unit configured to deflect multiple light beams emitted from the light source unit, and an imaging optical system configured to image the multiple light beams deflected by the deflecting unit on a surface to be scanned, the method including: adjusting incident positions of the multiple light beams in a sub-scanning direction, which are entered into an imaging optical element constituting the imaging optical system to adjust irradiated positions of the multiple light beams on the surface to be scanned; and adjusting the irradiated positions of the multiple light beams on the surface to be scanned in the sub-scanning direction without changing the incident positions.