The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2016
Filed:
Oct. 03, 2011
Hideo Kuroda, Kawasaki, JP;
Hirotada Watanabe, Yokohama, JP;
Yoichi Wada, Kawasaki, JP;
Yasujiro Kiyota, Tokyo, JP;
Ryuji Koshiba, Yokohama, JP;
Takayuki Uozumi, Machida, JP;
Hideo Kuroda, Kawasaki, JP;
Hirotada Watanabe, Yokohama, JP;
Yoichi Wada, Kawasaki, JP;
Yasujiro Kiyota, Tokyo, JP;
Ryuji Koshiba, Yokohama, JP;
Takayuki Uozumi, Machida, JP;
NIKON CORPORATION, Tokyo, JP;
Abstract
A biological specimen observation apparatus whereby observation of a biological specimen can be performed accurately. In macro observation, a biological change region is extracted from a macro image, a micro observation point corresponding to an extracted biological change region is registered, and an object for tracking is identified. In micro observation, it is judged from the micro image whether or not biological change has continued in the biological change region at the micro observation point, and the registered micro observation point is updated on the basis of this judgment result. It is possible to carry out both macro observation for detecting a biological change region and micro observation for observing the progress of growth of a partial minute region where biological change has been exhibited, and to carry out accurate observation of a biological specimen.