The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2016
Filed:
Oct. 28, 2011
Toshio Yamazaki, Tokyo, JP;
Toshio Yamazaki, Tokyo, JP;
MITAKA KOHKI CO., LTD., Tokyo, JP;
Abstract
An operation microscope includes: an ordinary light path that guides light from an observation target to an eyepiece; a first secondary light path branched off from the ordinary light path; a second secondary light path merging with the ordinary light path; an imaging unit that images the observation target using light from the first secondary path; a display unit that displays an image based on an image signal from the imaging unit toward the second secondary path; and a reflector provided at a branch point of the ordinary light path and the first secondary light path in such a manner as to be capable of pulling off the branch point, and that bends the ordinary light path by reflection. The first secondary light path extends from the branch point along an extension of the ordinary light path before being reflected.