The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2016
Filed:
May. 20, 2013
Yokogawa Electric Corporation, Musashino-shi, Tokyo, JP;
Mitsuhiro Iga, Musashino, JP;
YOKOGAWA ELECTRIC CORPORATION, Tokyo, JP;
Abstract
A microscope spectrometer in which, when an excitation light from a light source illuminates a sample, a light emitted from the sample that enters a microscope is analyzed, may include: a first optical means that forms the light emitted from the sample as a parallel beam; a first variable bandpass filter means having a variable wavelength passband that transmits incident light, which of the parallel beam of incident light, is light of a pre-established wavelength passband; a two-dimensional array light detection means that images the light in the wavelength passband; and a control means that controls the timing of the imaging by the two-dimensional array light detection means and, in accordance with the timing, changes the wavelength passband of the first variable bandpass filter means.