The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2016

Filed:

Jan. 22, 2014
Applicant:

Spectral Sciences, Inc., Burlington, MA (US);

Inventor:

Frank Oliver Clark, Lincoln, MA (US);

Assignee:

Spectral Sciences, Inc., Burlington, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/16 (2006.01); G01H 9/00 (2006.01); G01M 5/00 (2006.01); G01M 11/08 (2006.01);
U.S. Cl.
CPC ...
G01H 9/00 (2013.01); G01B 11/16 (2013.01); G01M 5/0066 (2013.01); G01M 5/0091 (2013.01); G01M 11/081 (2013.01);
Abstract

A method and device for remotely detecting structural integrity using reflections or scattering from windows or other portions of a structure. The long geometrical lever arm of a reflection on a building window, when viewed with suitable instruments, produces detectable modulation in the reflected light from minute vibrational changes upon the glass surface, revealing fundamental resonances and structural changes and failure in the building housing the window. By sensing very small changes in intensity and polarization, information may be obtained on fundamental resonances and structural changes, including failure or imminent failure of the structure.


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