The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2016

Filed:

Apr. 28, 2015
Applicant:

Thales, Courbevoie, FR;

Inventors:

Patrick Feneyrou, Palaiseau, FR;

Grégoire Pillet, Palaiseau, FR;

Jean Minet, Palaiseau, FR;

Assignee:

THALES, Courbevoie, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01S 17/32 (2006.01); G01S 7/491 (2006.01); G01S 17/36 (2006.01); G01S 13/34 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02083 (2013.01); G01S 7/4915 (2013.01); G01S 17/325 (2013.01); G01S 13/343 (2013.01); G01S 17/36 (2013.01);
Abstract

A method for generating M demodulation signals is disclosed. In one aspect, the method includes: providing M input signals, injecting each input signal into at least one first interferometer, and detecting M demodulation signals. The method also includes choosing M positive integers that are not all equal to zero and computing M demodulation signals. The idemodulation signal being the product of R+1 functions, Rbeing the chosen integer that corresponds to the first delay of the ifirst interferometer, and the pfunction being equal to S(t)=S(t=pτ), where p is an integer between 0 and R, τis the first delay introduced by the delay line of the ifirst interferometer, and S is a transform of the signal at the output of the ifirst interferometer.


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