The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2016
Filed:
Apr. 23, 2014
Canon Kabushiki Kaisha, Tokyo, JP;
Makoto Oigawa, Kawasaki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A depth measurement apparatus is adapted for acquiring a first and second image signals, calculating a correlation value for plural shift amounts, acquiring plural provisional shift amounts, reconstructing the first image signal using a filter corresponding to the provisional shift amounts, analyzing a contrast change by reconstruction, and determining depth on the basis of contrast analysis. The provisional shift amount is acquired by determining a first shift amount at which an extreme value of the correlation value is given, and a first range, which is a range of a predetermined shift amount including the first shift amount, into a plurality of second ranges, and acquiring provisional shift amounts for each of the second ranges.