The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2016
Filed:
Jan. 29, 2014
Raytheon Company, Waltham, MA (US);
David Buell, Goleta, CA (US);
John L. Vampola, Santa Barbara, CA (US);
Micky R. Harris, Lompoc, CA (US);
Steven Botts, Santa Barbara, CA (US);
RAYTHEON COMPANY, Waltham, MA (US);
Abstract
A combined scanning and staring (SCARING) focal plane array (FPA) imaging system having a plurality of modes of operation is provided. In one example, the SCARING FPA system includes a photodetector array with a plurality of photodetectors arranged in a plurality of photodetector rows, a readout integrated circuit (ROIC) coupled to the photodetector array, and a processor coupled to the ROIC. The processor coupled to the ROIC is configured to dynamically configure the SCARING FPA between a scanning mode of operation and a staring mode of operation.