The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2016
Filed:
Jun. 22, 2015
Freescale Semiconductor, Inc., Austin, TX (US);
FREESCALE SEMICONDUCTOR, INC., Austin, TX (US);
Abstract
A method and circuit for testing an analog-to-digital converter (ADC) are provided. The method comprises: coupling a single-ended output of an analog signal source to a differential input of an amplifier; coupling a differential output of the amplifier to a differential input of the ADC; alternately providing first and second test signals from the single-ended output of the analog signal source to first and second input terminals of the differential input of the amplifier; amplifying the first and second test signals to generate amplified differential signals at the differential output of the amplifier; providing the amplified differential signals to the differential input of the ADC; and determining if an output of the ADC is as expected. An offset may also be provided to the differential output of the amplifier. The method allows an ADC having a differential input to be tested using a digital-to-analog converter (DAC) having a single-ended output.