The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Feb. 02, 2016
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventor:

Tomohiko Ebata, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/00 (2006.01); H03M 1/10 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1009 (2013.01); H03M 1/001 (2013.01);
Abstract

In a conventional calibration method of an analog to digital converter, it has been difficult to easily derive a plurality of correction coefficients. A semiconductor apparatus according to an embodiment includes a plurality of unit elements that are provided to correspond to the total number of weights for each bit of the digital intermediate value b[1:0] output from a sub ADC, and the same capacitance, the same resistance value, or the same current value being set to the plurality of unit elements. Further included is a corresponding bit switching unit configured to switches the bits of the digital intermediate value based on which the plurality of unit elements generate analog values. At the time of calibration, combinations of the plurality of unit elements and the bits are rotated, and correction coefficients are derived by digital intermediate values obtained according to each combination.


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