The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Aug. 12, 2015
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, Tokyo, JP;

Inventors:

Akira Hokazono, Kawasaki Kanagawa, JP;

Yoshiyuki Kondo, Yokohama Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 29/78 (2006.01); H01L 29/417 (2006.01); H01L 29/167 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7839 (2013.01); H01L 29/167 (2013.01); H01L 29/41775 (2013.01);
Abstract

According to one embodiment, a tunnel FET includes a semiconductor region of a first conductivity type, a gate electrode provided on a surface portion of the semiconductor region via a gate insulating film, a source region provided in the semiconductor region on one side of the gate electrode, and a drain region provided in the semiconductor region on the other side of the gate electrode. The source region is a region of either the first conductivity type or a second conductivity type having a higher impurity concentration than the semiconductor region of the first conductivity type. The drain region includes a Schottky barrier junction.


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