The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Nov. 19, 2014
Applicant:

Dexerials Corporation, Tokyo, JP;

Inventor:

Taichi Koyama, Tochigi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08L 53/00 (2006.01); C08L 63/00 (2006.01); C08L 63/02 (2006.01); H01L 21/56 (2006.01); C08L 33/08 (2006.01); C08L 33/10 (2006.01); C08L 29/02 (2006.01); C08L 29/14 (2006.01); C08L 75/04 (2006.01); C08L 75/06 (2006.01); C08L 75/08 (2006.01); C08L 67/02 (2006.01); C08G 59/42 (2006.01); H01L 23/29 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/563 (2013.01); C08G 59/42 (2013.01); C08L 29/02 (2013.01); C08L 29/14 (2013.01); C08L 33/08 (2013.01); C08L 33/10 (2013.01); C08L 53/00 (2013.01); C08L 63/00 (2013.01); C08L 67/02 (2013.01); C08L 75/04 (2013.01); C08L 75/06 (2013.01); C08L 75/08 (2013.01); H01L 21/56 (2013.01); H01L 23/293 (2013.01); H01L 24/81 (2013.01); C08G 2261/126 (2013.01); H01L 2224/81091 (2013.01); H01L 2224/81815 (2013.01); H01L 2924/0002 (2013.01);
Abstract

A method for manufacturing a semiconductor device by using underfill material includes: a semiconductor chip mounting step configured to mount a semiconductor chip having a solder bump on a substrate via an underfill film including a film forming resin having a weight average molecular weight of not more than 30000 g/mol and a molecular weight distribution of not more than 2.0, an epoxy resin, and an epoxy curing agent; and a reflow step configured to solder-bond the semiconductor chip and the substrate by a reflow furnace. The film forming resin of the underfill material has a weight average molecular weight of not more than 30000 g/mol and a molecular weight distribution of not more than 2.0, and accordingly, the viscosity at the time of heat melting can be reduced, and a semiconductor chip can be mounted at a low pressure.


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