The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Jul. 27, 2011
Applicants:

Wang-jo Lee, Yongin, KR;

Hyung-soo Kim, Yongin, KR;

In-ho Choi, Yongin, KR;

Choon-yul OH, Yongin, KR;

Ho-ryun Chung, Yongin, KR;

Joo-hyeon Jeong, Yongin, KR;

Myoung-hwan Yoo, Yongin, KR;

Jin-woo Kim, Yongin, KR;

Naoaki Komiya, Yongin, KR;

Inventors:

Wang-Jo Lee, Yongin, KR;

Hyung-Soo Kim, Yongin, KR;

In-Ho Choi, Yongin, KR;

Choon-Yul Oh, Yongin, KR;

Ho-Ryun Chung, Yongin, KR;

Joo-Hyeon Jeong, Yongin, KR;

Myoung-Hwan Yoo, Yongin, KR;

Jin-Woo Kim, Yongin, KR;

Naoaki Komiya, Yongin, KR;

Assignee:

Samsung Display Co., Ltd., Samsung-ro, Giheung-Gu, Yongin-si, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01); G05F 1/00 (2006.01); G09G 3/32 (2016.01); G11C 19/18 (2006.01); G11C 19/28 (2006.01);
U.S. Cl.
CPC ...
G09G 3/3291 (2013.01); G11C 19/184 (2013.01); G11C 19/28 (2013.01); G09G 2310/0286 (2013.01);
Abstract

A scan driver includes: a plurality of scan driving blocks including an output terminal outputting a scan signal to a scan line; a first transistor transmitting a voltage of a power source to the output terminal; a second transistor transmitting a clock signal to the output terminal; and a third transistor including a gate electrode connected to a node formed with a gate-on voltage turning on the second transistor, one terminal connected to the power source, and the other terminal connected to the gate electrode of the first transistor. The scan driver may reduce the influence of a leakage current even though application of the scan signal is increased, and a scan signal of a uniform voltage level may be output.


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