The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Jan. 27, 2014
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventor:

Philip John Vander Broek, San Francisco, CA (US);

Assignee:

Splunk Inc., San Francisco, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/02 (2006.01); G06T 11/20 (2006.01); G06F 3/0484 (2013.01); G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06T 11/206 (2013.01); G06F 3/04847 (2013.01); G06Q 10/06 (2013.01);
Abstract

Systems and methods are provided for visualizing the number of events having different values for a field of interest over a selected time range. The events may be derived from machine data obtained from one or more data sources. User input received via a graphical user interface may specify the field of interest, a time range, and a time granularity for displaying counts of the number of events having various values during different time slots within the selected time range. Events including the specified field during the user-selected time range are identified and values for the field are extracted from the identified events. A visualization indicating a relation between a number of the events occurring within each of a plurality of time slots over the selected time range and each of the unique extracted values of the field is provided to the user via the graphical user interface.


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