The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2016
Filed:
Jun. 23, 2014
Google Inc., Mountain View, CA (US);
Jonathan Siegel, San Francisco, CA (US);
Allen Hutchison, San Jose, CA (US);
Wenfeng Li, Sunnyvale, CA (US);
Google Inc., Mountain View, CA (US);
Abstract
An exemplary method for surfacing feature changes occurring over time at a location is provided. The method includes identifying sets of images captured at a location over a period of time. The sets of images depict objects at the location. Visual changes at the location over the period of time are determined for a given physical feature of the objects depicted in images from the sets of images based on at least a comparison of features in corresponding areas of a first and a second 3D geometry of the location associated with the images. The first and second 3D geometries depict physical features of objects at the location at different times. The sets of images may be ranked based on the determined visual changes for each set. A given set of images from the sets of images may be selected for display on a user interface based on the ranking.