The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Jan. 14, 2015
Applicant:

Shenzhen China Star Optoelectronics Technology Co., Ltd., Shenzhen, Guangdong, CN;

Inventors:

Houliang Hu, Guangdong, CN;

Ping-sheng Kuo, Guangdong, CN;

Li-wei Chu, Guangdong, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/02 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/00 (2013.01); G06T 2207/20172 (2013.01);
Abstract

A method of grayscale compensation to defects on a display panel includes: (A) obtaining a set of coordination of the defect on the display panel, and determining a defect area where the defect locates based on the set of coordination; (B) obtaining a gamma curve of the defect, a gamma curve of a background of the defect area, and a standard gamma curve of the background of the display panel; (C) obtaining a standard gamma curve of the defect and a standard gamma curve of the background of the defect area; and (D) calculating a grayscale-compensation value for each grayscale of the defect, based on the standard gamma curve and the standard gamma curve of the background of the defect area. The present invention is to reduce calculation, and to achieve the best compensation to defects on a display panel.


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