The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Aug. 19, 2013
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventors:

Jeffrey Alan Bolz, Austin, TX (US);

Patrick R. Brown, Wake Forest, NC (US);

Tyson Bergland, San Francisco, CA (US);

Alexander Lev Minkin, Los Altos, CA (US);

Assignee:

NVIDIA Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/40 (2006.01); G06T 1/60 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 1/60 (2013.01); G06T 5/002 (2013.01); G06T 11/40 (2013.01);
Abstract

A system, method, and computer program product are provided for accessing multi-sample surfaces. A multi-sample store instruction that specifies data for a single sample of a multi-sample pixel and a sample mask is received and the data for the single sample is stored to each sample of the multi-sample pixel that is enabled according to the sample mask. A multi-sample load instruction that specifies a multi-sample pixel is received, and, in response to executing the multi-sample load instruction, data for one sample of the multi-sample pixel is received. A determination is made that the data for the one sample of the multi-sample pixel represents multi-sample pixel data for at least one additional sample of the multi-sample pixel.


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