The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Feb. 24, 2014
Applicant:

Hong Kong Applied Science and Technology Research Institute Co. Ltd., Shatin, New Territories, HK;

Inventors:

Xueyan Tang, Hong Kong, HK;

You Ding, Hong Kong, HK;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/34 (2006.01); G06K 9/00 (2006.01); G06T 7/20 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00389 (2013.01); G06K 9/00382 (2013.01); G06T 7/2033 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/30196 (2013.01);
Abstract

A system and method of detecting a posture of at least one predetermined part of an object comprising the steps of extracting a first object shape from a first image taken by a first image sensor, computing a characteristic dimension value of the predetermined part within a predetermined region of the first object shape, constructing a mask based on the characteristic dimension value, extracting a profile of the predetermined part from the first object shape by applying the mask on the first object shape, and identifying at least one predefined feature point in the profile of the predetermined part, thereby detecting the posture of the predetermined part is disclosed.


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