The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Aug. 25, 2011
Applicants:

Robert F. Dillon, Bedford, NH (US);

Bing Zhao, Newton, MA (US);

Inventors:

Robert F. Dillon, Bedford, NH (US);

Bing Zhao, Newton, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A62B 1/04 (2006.01); G06K 9/00 (2006.01); A61C 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00201 (2013.01); A61C 9/006 (2013.01); G06K 2209/05 (2013.01);
Abstract

Described are methods that enable rapid automated object classification of measured three-dimensional object scenes. Each method can be performed during a three-dimensional measurement procedure while data are being acquired or after completion of the measurement procedure using the acquired data. In various embodiments, an object scene is illuminated with an optical beam and an image is acquired. In some embodiments, the object scene is illuminated with a structured light pattern and a sequence of images of the object scene illuminated by the pattern at different spatial phases is acquired. Coordinates are determined for points in the one or more images and a translucence value is determined for each of the points. An object class is determined for each point based on the translucence value for the point. Optionally, additional information, such as grayscale or color image data for each point, is used to supplement the object class determination.


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