The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2016
Filed:
Dec. 20, 2012
Applicant:
Teradata Us, Inc., Dayton, OH (US);
Inventors:
Rama Krishna Korlapati, El Segundo, CA (US);
Haiyan Chen, Chappaqua, NY (US);
Assignee:
Teradata US, Inc., Dayton, OH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30469 (2013.01);
Abstract
Techniques for query statistics inheritance are provided. Statistics for a database are used to determine selectivity estimates for sparse joins and tables being joined together within a given query. These statistics are inherited up to the given query along with the selectivity estimates and provided to a database optimizer to use when developing query plans and selecting an optimal query plan for the given query.