The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Oct. 23, 2013
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Yasunori Hashimoto, Tokyo, JP;

Ryota Mibe, Tokyo, JP;

Kentaro Yoshimura, Tokyo, JP;

Hirofumi Danno, Tokyo, JP;

Sadahiro Ishikawa, Tokyo, JP;

Kiyoshi Yamaguchi, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30306 (2013.01); G06F 17/30292 (2013.01);
Abstract

A database analyzer includes a data sorting unit sorting a data group acquired from an analysis target database based on data values in a table column and storing it as analysis target data in a storage unit; a data pattern creation processing unit creating a group for each data value based on differences between the data values and storing a data pattern in the storage unit; a data pattern judgment processing unit for judging validity of the data pattern; and a data pattern transformation processing unit for reconstructing the data pattern with respect to constituent elements of each group included in the data pattern by transforming each group in accordance with a specified conversion rule for converting the constituent elements, which are conceptually similar to each other, into the same constituent element, and storing it in the storage unit if a negative result is obtained for the validity judgment.


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