The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Aug. 09, 2010
Applicants:

Genbao Shi, Sugar Land, TX (US);

Zitao Xu, Katy, TX (US);

Jeffrey Yarus, Houston, TX (US);

Richard L. Chambers, Bixby, OK (US);

Randy Guetter, Detroit Lakes, MN (US);

Inventors:

Genbao Shi, Sugar Land, TX (US);

Zitao Xu, Katy, TX (US);

Jeffrey Yarus, Houston, TX (US);

Richard L. Chambers, Bixby, OK (US);

Randy Guetter, Detroit Lakes, MN (US);

Assignee:

Landmark Graphics Corporation, Houston, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01); G06F 17/10 (2006.01); G06F 17/17 (2006.01); G01V 99/00 (2009.01); G06T 17/05 (2011.01); G06T 17/20 (2006.01); G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/17 (2013.01); G01V 99/005 (2013.01); G06T 17/05 (2013.01); G06T 17/20 (2013.01); G01V 1/302 (2013.01); G01V 2210/641 (2013.01); G01V 2210/642 (2013.01); G01V 2210/665 (2013.01);
Abstract

Systems and methods for creating a surface in a faulted space, which includes using interpolation techniques.


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