The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Jan. 21, 2016
Applicant:

Echo Laboratories, Inc., San Diego, CA (US);

Inventors:

Eugene L. Cho, San Diego, CA (US);

Ryan P. Talbot, San Diego, CA (US);

Gregory J. Gemmen, San Diego, CA (US);

Eric R. Garcia, Los Angeles, CA (US);

Assignee:

Echo Laboratories, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/26 (2006.01); G02B 21/08 (2006.01); G02B 21/02 (2006.01); G02B 21/24 (2006.01); G02B 21/00 (2006.01); G02B 21/34 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0088 (2013.01); G02B 21/02 (2013.01); G02B 21/26 (2013.01); G02B 21/34 (2013.01);
Abstract

A dual-configuration microscope is provided. The microscope may be converted into an upright configuration or an inverted configuration. The microscope includes a base. The microscope further includes a body having a first portion and a second portion, wherein the body is rotatably coupled to the base at a rotational coupling. The microscope further includes one or more objectives coupled to the first portion of the body, a condenser coupled to the second portion of the body and a stage positioned between the one or more objectives and the condenser. The stage includes a first specimen supporting surface and a second specimen supporting surface, wherein the second specimen supporting surface is positioned opposite the first specimen supporting surface.


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