The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Aug. 28, 2014
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Cicero Silveira Vaucher, Eindhoven, NL;

Mingda Huang, Eindhoven, NL;

Antonius de Graauw, Haelen, NL;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/04 (2006.01); G01R 31/02 (2006.01); G01R 31/28 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/02 (2013.01); G01R 31/048 (2013.01); G01R 31/2822 (2013.01); G01R 31/006 (2013.01);
Abstract

The invention provides a testing circuit for testing a connection between a chip and external circuitry. A current source is used to inject a DC current towards the connection to be tested from the chip side. On-chip ESD protection is provided giving a path between the connection to be tested and a fixed voltage line. A shunt path is also coupled to the connection to be tested on the external circuitry side. It is determined if the current source current flows through the ESD protection circuit, and this can be used to determine whether or not the connection to be tested presents an open circuit for the DC test current.


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