The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2016
Filed:
May. 23, 2013
Applicant:
Globalfoundries Inc., Grand Cayman, KY;
Inventors:
David R. Goulet, Milton, VT (US);
Walter V. Lepuschenko, Fairfax, VT (US);
Assignee:
GLOBALFOUNDRIES Inc., Grand Cayman, KY;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/00 (2006.01); G01R 1/067 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06738 (2013.01); G01R 3/00 (2013.01); G01R 35/00 (2013.01); H01J 2237/208 (2013.01); H01J 2237/3174 (2013.01);
Abstract
A probe, comprising: a shank region having a top surface integrally connected to a bottom surface of a conical region; a pyramidal tip region having a base surface integrally connected to a top surface of the conical region; and wherein the base surface of the pyramidal tip region is contained within a perimeter of the top surface of the conical region. Also a method of fabricating the probe and a method of probing devices under test.
Goulet, David. (2016). Method of reconstructing electrical probes (U.S. Patent No. 9435828). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9435828
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile