The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2016
Filed:
Sep. 11, 2013
Applicant:
Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;
Inventors:
Toyohiko Yamauchi, Hamamatsu, JP;
Norikazu Sugiyama, Hamamatsu, JP;
Tadashi Fukami, Hamamatsu, JP;
Hidenao Iwai, Hamamatsu, JP;
Assignee:
HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/04 (2006.01); G01N 33/483 (2006.01); G01N 15/14 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 33/4833 (2013.01); C12Q 1/04 (2013.01); G01N 15/1456 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1497 (2013.01);
Abstract
The present invention provides a method for determining differentiation level of pluripotent stem cell, comprising a step of determining a flatness of cultured pluripotent stem cell, wherein the flatness is an indication.