The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Jan. 16, 2013
Applicant:

Biaoqi Electronics Technology Co., Ltd., Guangzhou Science, CN;

Inventors:

Guangjun Song, Guangzhou, CN;

Xiangli Zheng, Guangzhou, CN;

Jianfeng Wu, Guangzhou, CN;

Ling Gao, Guangzhou, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/87 (2006.01); G01N 21/55 (2014.01);
U.S. Cl.
CPC ...
G01N 21/87 (2013.01); G01N 21/55 (2013.01); G01N 2201/061 (2013.01); G01N 2201/065 (2013.01); G01N 2201/0633 (2013.01); G01N 2201/0636 (2013.01);
Abstract

A reflectance spectroscopy measuring and sampling system for gemstone testing is disclosed. The system includes a first light source (), a second light source (), a light filtering element, an integrating sphere (S), an optical fiber (), a spectroscopic detection module (), an analog-digital conversion module () and a data processing terminal (), wherein the integrating sphere (S) is provided with an entrance port, a sampling opening () and a reflected light exit port (). A reflectance spectroscopy measuring and sampling method for gemstone testing is also disclosed. The system and the method have an excellent performance and can be widely used in the gemstone identification.


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