The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Nov. 01, 2013
Applicant:

Board of Trustees of Michigan State University, East Lansing, MA (US);

Inventors:

Maria I. Rubino, East Lansing, MI (US);

Rafael A. Auras, Okemos, MI (US);

Krishnamurthy Jayaraman, East Lansing, MI (US);

Yining Xia, Lansing, MI (US);

Carlos Diaz, West Henrietta, NY (US);

Joe Hotchkiss, East Lansing, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/643 (2013.01);
Abstract

A method of monitoring a location of a nanoparticle within a material is described herein. The method includes the steps of providing at least one nanoclay particle, attaching a fluorescent tag to the at least one nanoclay particle, and determining a fluorescence of the fluorescent-labeled nanoclay particle. The method also includes forming the material including the at least one fluorescent-labeled nanoclay particle, depositing the material in an aqueous solution, and detecting a movement of the fluorescent-labeled nanoclay particle from the material to the aqueous solution.


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