The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2016
Filed:
May. 08, 2015
Scattering Solutions, Inc., Irvine, CA (US);
Anthony E. Smart, Costa Mesa, CA (US);
William V. Meyer, Lakewood, OH (US);
Craig J. Saltiel, Irvine, CA (US);
Scattering Solutions, Inc., Irvine, CA (US);
Abstract
Apparatus are described for measuring the characteristics of colloidal particles suspended in transparent media by Dynamic Light Scattering (DLS) and Depolarized Dynamic Light Scattering (DDLS) into regions where conventional measurements are difficult or impractical. Matching the diameter of an illuminating beam and an intersecting diameter of a field stop image extends measurements into regions that include concentrated turbid suspensions that frequently appear so visually opaque that multiple scattering typically gives a falsely low estimate of particle size. At the opposite extreme, where insufficient signal is available to determine either or both of the translational and/or rotational relaxation times of the particles, typically where they are too small, too few, or of insufficient refractive index difference from the medium to scatter enough light, measurements can be improved by: a) using a sufficiently large aperture such that many coherence areas fall upon the detector; and b) optical homodyne amplification of the scattered signal.