The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2016

Filed:

Oct. 06, 2014
Applicants:

Abraham Schwartz, San Juan, PR (US);

Martin C. Cohen, Laurel, MD (US);

Peter Ingram, Raleigh, NC (US);

Inventors:

Abraham Schwartz, San Juan, PR (US);

Martin C. Cohen, Laurel, MD (US);

Peter Ingram, Raleigh, NC (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/18 (2006.01); G01J 3/44 (2006.01); G01N 21/27 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0297 (2013.01); G01J 3/18 (2013.01); G01J 3/4406 (2013.01); G01N 21/274 (2013.01);
Abstract

The present invention is a method of obtaining and isolating sample spectra from a wide wavelength illumination source without the use of filters. The method obtains the combined sample and illumination spectra of a sample and removes the illumination spectrum from the combined spectrum. This is accomplished by obtaining both the combined sample/illumination spectrum and the illumination spectrum separately at the same time and under the same environmental and instrument conditions. The illumination spectrum is then subtracted, wavelength by wavelength from the combined sample/illumination spectrum, leaving the pure sample spectrum which may a single spectrum or combination of two or more spectra from different types and/or compounds in the sample.


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