The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2016

Filed:

Dec. 09, 2015
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Kee-bong Song, San Diego, CA (US);

Shengshan Cui, San Diego, CA (US);

Hairuo Zhuang, San Diego, CA (US);

Yangwen Liang, San Diego, CA (US);

Vignesh Sethuraman, La Jolla, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/20 (2009.01); H04W 48/16 (2009.01);
U.S. Cl.
CPC ...
H04W 48/16 (2013.01); H04W 4/20 (2013.01);
Abstract

Apparatuses (including user equipment (UE) and modem chips for UE), systems, and methods for reducing false alarms (FAs) and miss-detections (MDs) in cell search results are described. In one method, the minimum of a value for the accumulated metric for a first short code and a value for the accumulated metric for a second short code is used as a pruning metric for each candidate cell. One or more thresholds are applied to the pruning metric to determine whether the candidate cell will be pruned from the final candidate cell list.


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