The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2016

Filed:

Sep. 26, 2012
Applicants:

Vidya Narayanan, San Diego, CA (US);

Pawel Lukowicz, Hochspeyer, DE;

Lukas D Kuhn, San Diego, CA (US);

Jin Won Lee, San Diego, CA (US);

Sanjiv Nanda, Ramona, CA (US);

Inventors:

Vidya Narayanan, San Diego, CA (US);

Pawel Lukowicz, Hochspeyer, DE;

Lukas D Kuhn, San Diego, CA (US);

Jin Won Lee, San Diego, CA (US);

Sanjiv Nanda, Ramona, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01); H04W 24/00 (2009.01); H04W 4/02 (2009.01); H04W 4/04 (2009.01); H04W 64/00 (2009.01); G06F 15/16 (2006.01); H04W 4/20 (2009.01);
U.S. Cl.
CPC ...
H04W 4/021 (2013.01); G06F 17/30241 (2013.01); G06F 17/30598 (2013.01); H04W 4/023 (2013.01); H04W 4/043 (2013.01); H04W 64/00 (2013.01); H04W 4/206 (2013.01); Y10S 707/921 (2013.01);
Abstract

One or more mobile devices make measurements while moving along a path. Each measurement may comprise a specific group of identifiers of wireless transmitters, and strengths of corresponding wireless signals. A set of measurements are made in a sequence along a path, and the subsets of the measurements are identified for satisfying a test on a value of a measure of similarity of measurements included in the subset. A new place of relevance is identified, by comparing the just-described subsets of the measurements with similar subsets of additional measurements (e.g. by clustering). Alternatively, a known place of relevance (e.g. having a label) is identified, by comparing the just-described subsets of the measurements with pre-computed model of measurements. Also, the just-described subsets of the measurements may be compared with corresponding subsets of measurements of another path, e.g. to identify common portions therein.


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