The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2016
Filed:
May. 20, 2015
Fujifilm Corporation, Tokyo, JP;
Katsuto Sumi, Ashigarakami-gun, JP;
Osamu Kuroda, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Disclosed are an image defect detection device, method and an imaging unit capable of reliably detecting image defect, such as stripe unevenness or scratches, even if a comparatively inexpensive and low resolution imaging unit is used. An image reading unit has a plurality of read pixels arranged in a second direction intersecting a first direction and reads an image recorded on a recording medium by a single-pass recording head, which is relatively moved in the first direction. A birefringent plate shifts and duplexes the image at least in the second direction by performing birefringence of image light of the image. The birefringent plate makes the width of image defect in the second direction on the read pixels greater than the pitch of the read pixels. A detection unit which detects image defect included in the image and extended in the first direction based on the reading result of the image.