The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2016

Filed:

Oct. 28, 2015
Applicants:

Seung-hyun OH, Seoul, KR;

Jong-woo Lee, Seoul, KR;

Thomas Byung-hak Cho, Gyeonggi-do, KR;

Inventors:

Seung-Hyun Oh, Seoul, KR;

Jong-Woo Lee, Seoul, KR;

Thomas Byung-Hak Cho, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/06 (2006.01); H03M 1/12 (2006.01); H03M 1/66 (2006.01); H03M 1/80 (2006.01); H03M 1/00 (2006.01);
U.S. Cl.
CPC ...
H03M 1/06 (2013.01); H03M 1/12 (2013.01); H03M 1/66 (2013.01); H03M 1/00 (2013.01); H03M 1/804 (2013.01);
Abstract

Provided is an apparatus for analog-digital converting that includes a Most Significant Bit (MSB)-Digital Analog Converter (DAC) for converting a digital signal into an analog signal, a trim capacitor, a Least Significant Bit (LSB)-DAC, coupled to the trim capacitor, for converting a digital signal into an analog signal, a bridge capacitor connecting the MSB-DAC and the LSB-DAC, a comparator for measuring a voltage value at the MSB-DAC and LSB-DAC and outputting a result of comparing with a sampled voltage value, and a controller for generating first measurement data by digital converting a first measurement value output from the comparator by applying a reference voltage to a unit capacitor of the MSB-DAC, for generating second measurement data by digital converting a second measurement value output from the comparator by applying the reference voltage to the LSB-DAC, and controlling the trim capacitor by comparing the first and second measurement data.


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