The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2016
Filed:
Aug. 30, 2013
International Business Machines Corporation, Armonk, NY (US);
Jennifer L. Milam, Austin, TX (US);
Eric W. Leong, Austin, TX (US);
Pamela A. Nesbitt, Austin, TX (US);
Jonathan W. Stoecker, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and a computer program product for displaying data in a graphical overlay. The method includes overlaying a first lens, including a first dataset, on a first region of the graphical overlay while a second lens, including a second dataset, overlaps the first lens. The first and second datasets are simultaneously displayed, and a correlation between the datasets is determined. Separation of the first and second lenses preserves a circumscribed region within each lens. The first dataset corresponds to first orientation position of the first lens. Rotation of the first lens to a second orientation position reconfigures the first dataset to provide a modified first dataset which corresponds to the second position. A rotational position may also be associated with points in time, a first position corresponding to a first point in time and the first dataset representing the first dataset at the first point in time.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile