The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2016

Filed:

Jul. 17, 2014
Applicant:

Stc.unm, Albuquerque, NM (US);

Inventors:

Majeed M. Hayat, Albuquerque, NM (US);

Sanjay Krishna, Albuquerque, NM (US);

Sebastian Eugenio Godoy, Albuquerque, NM (US);

Assignee:

STC.UNM, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G06K 9/62 (2006.01); G06K 9/46 (2006.01); G06T 7/40 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0085 (2013.01); G06K 9/4638 (2013.01); G06K 9/4652 (2013.01); G06K 9/6268 (2013.01); G06K 9/6289 (2013.01); G06T 7/408 (2013.01); G06T 2207/10036 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30184 (2013.01);
Abstract

Apparatus, systems, and methods fusing material classification with spatio-spectral edge detection in spectral imagery can be used in a variety of applications. In various embodiments, a classifier can be applied to neighboring pixels in data for an image to determine, based on material changes, if the neighboring pixels are correlated to two different materials with respect to a candidate location for an edge. Results of the classification can be used with a spatio-spectral mask to accept or reject the candidate location as an edge. Additional apparatus, systems, and methods are disclosed.


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